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IICT7083370832<>70834
TagInd1Ind2CodeValue
0010070833
00520120823010026.0
035 a0018314
035 a0025083
035 a0069163
100 a20150519 y0pory0103 ba
1010 aeng
102 aFR
2001 aAutomated SXRF analysis of trace elements in geological samples
edifficulties associated to chemical bonding effects
fM. O. Figueiredo, et alli.
463 aHighlights in X-Ray synchrotron radiation research
eAbstract Booklet (Grenoble, 17-20 Nov 1997)
fESRF
vs.l.
463 es.n., 1997
vp. 56 (Resumo)
606 aFranca
606 aReunioes internacionais
606 aRaios X
606 aEspectroscopia
606 aMetodos quantitativos
606 aQuimica
606 aMineralogia
606 aGeologia
686 aBCI
686 aY
700 1aFigueiredo
bM.O.
801 0aPT
bIICT
c20150519
gRPC
930 dCDI 23902
936y
9370
938ba
955 c20070416
dADMIN
n1
966 b23/08/2012
lMLITD
sCDI 23902
w2089871648
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